Semiconductor Test | Products | S.E.R. Corporation

We provide semiconductor test solutions using our own spring probe technology.
We offer test applications and high-level contact technology for wafer test, final test and system level test in mass production.

LSI high frequency test

Coaxial Socket

Multi Impedance Socket

Inter-unit connection for high-frequency signals

mm Wave Interposer

ARDENT CONCEPTS

Burn-in Test

Crystal・MEMS Device Socket

Sullins

Probe Card

Probe Card Socket for WLCSP

Socket Application

Socket for BGA・LGA

Image Sensor Socket

FPGA Socket

High Speed Signal Probing Socket

Crystal・MEMS Device Socket

Product Board Socket (YOROI)