Kelvin Contact
Product Outline
Our kelvin contact is possible to support multi-DUT testing with 4-wire method that can cancel contact resistance. It is ideal for various probe card application for small devices such as WLCSP. The probe unit consists of fine-pitch vertical probe built in the socket cavity which is manufactured with ultra-precision processing technology.
Contact Image
Features
- Possible to make “Kelvin Contact” for φ150μm solder balls/bumps.
- Long life cycle with 3 million touchdowns.
- Supports multi-DUT testing such as WLCSP.
Probe Unit